Moamar Sayed Mouchaweh, Alexandre Philippot, Véronique Carré-Ménétrier, Bernard Riera. Timed-Event-State-Based Diagnoser for Manufacturing Systems. In Weiming Shen, editor, Information Technology For Balanced Manufacturing Systems - IFIP TC5, WG 5.5 Seventh International Conference on Information Technology for Balanced Automation Systems in Manufacturing and Services, Niagara Falls, Ontario, Canada, September 4-6, 2006. Volume 220 of IFIP, pages 415-424, Springer, 2006. [doi]
@inproceedings{MouchawehPCR06,
title = {Timed-Event-State-Based Diagnoser for Manufacturing Systems},
author = {Moamar Sayed Mouchaweh and Alexandre Philippot and Véronique Carré-Ménétrier and Bernard Riera},
year = {2006},
doi = {10.1007/978-0-387-36594-7_44},
url = {http://dx.doi.org/10.1007/978-0-387-36594-7_44},
researchr = {https://researchr.org/publication/MouchawehPCR06},
cites = {0},
citedby = {0},
pages = {415-424},
booktitle = {Information Technology For Balanced Manufacturing Systems - IFIP TC5, WG 5.5 Seventh International Conference on Information Technology for Balanced Automation Systems in Manufacturing and Services, Niagara Falls, Ontario, Canada, September 4-6, 2006},
editor = {Weiming Shen},
volume = {220},
series = {IFIP},
publisher = {Springer},
isbn = {978-0-387-36590-9},
}