Moamar Sayed Mouchaweh, Alexandre Philippot, Véronique Carré-Ménétrier, Bernard Riera. Timed-Event-State-Based Diagnoser for Manufacturing Systems. In Weiming Shen, editor, Information Technology For Balanced Manufacturing Systems - IFIP TC5, WG 5.5 Seventh International Conference on Information Technology for Balanced Automation Systems in Manufacturing and Services, Niagara Falls, Ontario, Canada, September 4-6, 2006. Volume 220 of IFIP, pages 415-424, Springer, 2006. [doi]
Abstract is missing.