External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

Dynamic simulation of migration induced failure mechanism in integrated circuit interconnects

Aymen Moujbani, Jörg Kludt, Kirsten Weide-Zaage, Markus Ackermann, Verena Hein, Lutz Meinshausen. Dynamic simulation of migration induced failure mechanism in integrated circuit interconnects. Microelectronics Reliability, 53(9-11):1365-1369, 2013. [doi]

References

No references recorded for this publication.

Cited by

No citations of this publication recorded.

runs on