Aymen Moujbani, Jörg Kludt, Kirsten Weide-Zaage, Markus Ackermann, Verena Hein, Lutz Meinshausen. Dynamic simulation of migration induced failure mechanism in integrated circuit interconnects. Microelectronics Reliability, 53(9-11):1365-1369, 2013. [doi]
Abstract is missing.