Automatic Test Pattern Generation and Compaction for Deep Neural Networks - researchr publication authors

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Dina Moussa, Michael Hefenbrock, Christopher Münch, Mehdi B. Tahoori. Automatic Test Pattern Generation and Compaction for Deep Neural Networks. In Atsushi Takahashi 0001, editor, Proceedings of the 28th Asia and South Pacific Design Automation Conference, ASPDAC 2023, Tokyo, Japan, January 16-19, 2023. pages 436-441, ACM, 2023. [doi]

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