Compact Test Pattern Generation For Multiple Faults In Deep Neural Networks - researchr publication authors

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Dina A. Moussa, Michael Hefenbrock, Mehdi B. Tahoori. Compact Test Pattern Generation For Multiple Faults In Deep Neural Networks. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2023, Antwerp, Belgium, April 17-19, 2023. pages 1-2, IEEE, 2023. [doi]

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