Sequential Pattern Mining of Longitudinal Adverse Events After Left Ventricular Assist Device Implant

Faezeh Movahedi, Robert L. Kormos, Lisa C. Lohmueller, Laura Seese, Manreet K. Kanwar, Srinivas Murali, Yiye Zhang, Rema Padman, James F. Antaki. Sequential Pattern Mining of Longitudinal Adverse Events After Left Ventricular Assist Device Implant. IEEE Transactions on Information Technology in Biomedicine, 24(8):2347-2358, 2020. [doi]

Abstract

Abstract is missing.