High Speed, Fine Resolution Pattern Generation Using the Matched Delay Technique

Gary C. Moyer, Mark Clements, Wentai Liu, Toby Schaffer, Ralph K. Cavin III. High Speed, Fine Resolution Pattern Generation Using the Matched Delay Technique. In ISCAS. pages 405-408, 1995.

Authors

Gary C. Moyer

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Mark Clements

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Wentai Liu

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Toby Schaffer

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Ralph K. Cavin III

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