Structural Test Approach for Embedded Analog Circuits Based on a Built-in Current Sensor

Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho. Structural Test Approach for Embedded Analog Circuits Based on a Built-in Current Sensor. J. Electronic Testing, 27(2):177-192, 2011. [doi]

Authors

Román Mozuelos

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Yolanda Lechuga

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Mar Martínez

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Salvador Bracho

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