Isolation of Failing Scan Cells through Convolutional Test Response Compaction - researchr publication authors

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Grzegorz Mrugalski, Janusz Rajski, Chen Wang, Artur Pogiel, Jerzy Tyszer. Isolation of Failing Scan Cells through Convolutional Test Response Compaction. J. Electronic Testing, 23(1):35-45, 2007. [doi]

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