Theoretical analysis for low-power test decompression using test-slice duplication - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Szu-Pang Mu, Mango Chia-Tso Chao. Theoretical analysis for low-power test decompression using test-slice duplication. In 28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA. pages 147-152, IEEE Computer Society, 2010. [doi]

This author has not been identified. Look up 'Szu-Pang Mu' in GoogleThis author has not been identified. Look up 'Mango Chia-Tso Chao' in Google

runs on WebDSL