Szu-Pang Mu, Mango Chia-Tso Chao. Theoretical analysis for low-power test decompression using test-slice duplication. In 28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA. pages 147-152, IEEE Computer Society, 2010. [doi]
@inproceedings{MuC10,
title = {Theoretical analysis for low-power test decompression using test-slice duplication},
author = {Szu-Pang Mu and Mango Chia-Tso Chao},
year = {2010},
doi = {10.1109/VTS.2010.5469591},
url = {http://dx.doi.org/10.1109/VTS.2010.5469591},
tags = {testing, analysis, slicing},
researchr = {https://researchr.org/publication/MuC10},
cites = {0},
citedby = {0},
pages = {147-152},
booktitle = {28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA},
publisher = {IEEE Computer Society},
isbn = {978-1-4244-6648-1},
}