Chenyu Mu, Yijun Qu, Jiexi Yan, Erkun Yang, Cheng Deng 0002. Meta-Learning Dynamic Center Distance: Hard Sample Mining for Learning with Noisy Labels. In IEEE/CVF International Conference on Computer Vision, ICCV 2025, Honolulu, HI, USA, October 19-25, 2025. pages 415-425, IEEE, 2025. [doi]
Abstract is missing.