Joachim Mucha, Wilfried Daehn, Josef Gross. Self-Test in a Standard Cell Environment. IEEE Design & Test of Computers, 3(6):35-41, 1986. [doi]
@article{MuchaDG86,
title = {Self-Test in a Standard Cell Environment},
author = {Joachim Mucha and Wilfried Daehn and Josef Gross},
year = {1986},
doi = {10.1109/MDT.1986.295051},
url = {https://doi.org/10.1109/MDT.1986.295051},
researchr = {https://researchr.org/publication/MuchaDG86},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {3},
number = {6},
pages = {35-41},
}