Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
A. Muehlhoff. Inversion of degradation direction of n-channel MOS-FETs in off-state operation. Microelectronics Reliability, 42(9-11):1453-1456, 2002. [doi]
Abstract is missing.