Impact of Dynamic Trapping on High Frequency Organic Field-Effect Transistors - researchr publication authors

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Markus Mueller, Shabnam Donnhäuser, Sven Mothes, Anibal Pacheco-Sanchez, Katherina Haase, Stefan C. B. Mannsfeld, Martin Claus. Impact of Dynamic Trapping on High Frequency Organic Field-Effect Transistors. In Andrzej Napieralksi, editor, 27th International Conference on Mixed Design of Integrated Circuits and System, MIXDES 2020, Wroclaw, Poland, June 25-27, 2020. pages 40-44, IEEE, 2020. [doi]

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