Markus Mueller, Shabnam Donnhäuser, Sven Mothes, Anibal Pacheco-Sanchez, Katherina Haase, Stefan C. B. Mannsfeld, Martin Claus. Impact of Dynamic Trapping on High Frequency Organic Field-Effect Transistors. In Andrzej Napieralksi, editor, 27th International Conference on Mixed Design of Integrated Circuits and System, MIXDES 2020, Wroclaw, Poland, June 25-27, 2020. pages 40-44, IEEE, 2020. [doi]
@inproceedings{MuellerDMPHMC20,
title = {Impact of Dynamic Trapping on High Frequency Organic Field-Effect Transistors},
author = {Markus Mueller and Shabnam Donnhäuser and Sven Mothes and Anibal Pacheco-Sanchez and Katherina Haase and Stefan C. B. Mannsfeld and Martin Claus},
year = {2020},
url = {https://ieeexplore.ieee.org/document/9155644},
researchr = {https://researchr.org/publication/MuellerDMPHMC20},
cites = {0},
citedby = {0},
pages = {40-44},
booktitle = {27th International Conference on Mixed Design of Integrated Circuits and System, MIXDES 2020, Wroclaw, Poland, June 25-27, 2020},
editor = {Andrzej Napieralksi},
publisher = {IEEE},
isbn = {978-83-63578-18-3},
}