Maritza R. Muguira, Jonathan R. Salton, David K. Novick, Jesse N. Schwebach, Christopher W. Wilson. Chile identification for metrics in the chile industry. In Proceedings of the IEEE International Conference on Systems, Man and Cybernetics, Waikoloa, Hawaii, USA, October 10-12, 2005. pages 3118-3123, IEEE, 2005. [doi]
@inproceedings{MuguiraSNSW05,
title = {Chile identification for metrics in the chile industry},
author = {Maritza R. Muguira and Jonathan R. Salton and David K. Novick and Jesse N. Schwebach and Christopher W. Wilson},
year = {2005},
doi = {10.1109/ICSMC.2005.1571625},
url = {http://dx.doi.org/10.1109/ICSMC.2005.1571625},
researchr = {https://researchr.org/publication/MuguiraSNSW05},
cites = {0},
citedby = {0},
pages = {3118-3123},
booktitle = {Proceedings of the IEEE International Conference on Systems, Man and Cybernetics, Waikoloa, Hawaii, USA, October 10-12, 2005},
publisher = {IEEE},
isbn = {0-7803-9298-1},
}