Maritza R. Muguira, Jonathan R. Salton, David K. Novick, Jesse N. Schwebach, Christopher W. Wilson. Chile identification for metrics in the chile industry. In Proceedings of the IEEE International Conference on Systems, Man and Cybernetics, Waikoloa, Hawaii, USA, October 10-12, 2005. pages 3118-3123, IEEE, 2005. [doi]
No references recorded for this publication.
No citations of this publication recorded.