Peter Muhmenthaler. New on-Chip DFT and ATE Features for Efficient Embedded Memory Test. In 14th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2006), 2-4 August 2006, Taipei, Taiwan. IEEE Computer Society, 2006. [doi]
@inproceedings{Muhmenthaler06,
title = {New on-Chip DFT and ATE Features for Efficient Embedded Memory Test},
author = {Peter Muhmenthaler},
year = {2006},
doi = {10.1109/MTDT.2006.20},
url = {http://doi.ieeecomputersociety.org/10.1109/MTDT.2006.20},
tags = {testing},
researchr = {https://researchr.org/publication/Muhmenthaler06},
cites = {0},
citedby = {0},
booktitle = {14th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2006), 2-4 August 2006, Taipei, Taiwan},
publisher = {IEEE Computer Society},
isbn = {0-7695-2572-5},
}