Peter Muhmenthaler - researchr alias

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Viewing Publication 1 - 11 from 11

2006

Session AbstractAjay Khoche, Peter Muhmenthaler. vts 2006: 288-289 [doi]

New on-Chip DFT and ATE Features for Efficient Embedded Memory TestPeter Muhmenthaler. mtdt 2006: [doi]

2005

Compression mode diagnosis enables high volume monitoring diagnosis flowAndreas Leininger, Peter Muhmenthaler, Wu-Tung Cheng, Nagesh Tamarapalli, Wu Yang, Hans Tsai. itc 2005: 10 [doi]

2004

Diagnosis of Scan-Chains by Use of a Configurable Signature Register and Error-Correcting CodeAndreas Leininger, Michael Gössel, Peter Muhmenthaler. date 2004: 1302-1309 [doi]

2003

Industrial Experience with Adoption of EDT for Low-Cost Test without ConcessionsFrank Poehl, Matthias Beck, Ralf Arnold, Peter Muhmenthaler, Nagesh Tamarapalli, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski. itc 2003: 1211-1220 [doi]

2002

Outsourcing Test without Standards?Peter Muhmenthaler. itc 2002: 1217-1218 [doi]

2001

Embedded tutorial: TRP: integrating embedded test and ATEYervant Zorian, Paolo Prinetto, João Paulo Teixeira, Isabel C. Teixeira, Carlos Eduardo Pereira, Octávio Páscoa Dias, Jorge Semião, Peter Muhmenthaler, W. Radermacher. date 2001: 34-37 [doi]

2000

Tutorial StatementYervant Zorian, Michael Nicolaidis, Peter Muhmenthaler, David Y. Lepejian, Chris W. H. Strolenberg, Kees Veelenturf. date 2000: 66 [doi]

1999

Cost effective testing of systems on silicon: areas for optimizationPeter Muhmenthaler. ets 1999: 142-143 [doi]

1991

Test Pattern Development and Evaluation for DRAMs with Fault Simulator RAMSIMH.-D. Oberle, Peter Muhmenthaler. itc 1991: 548-555

Enhanced fault modeling for DRAM test and analysisH.-D. Oberle, M. Maue, Peter Muhmenthaler. vts 1991: 149-154 [doi]

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