Frank Poehl - researchr alias

researchr

You are not signed in
Sign in
Sign up

Viewing Publication 1 - 8 from 8

2012

Highly Efficient Test Response Compaction Using a Hierarchical X-Masking TechniqueThomas Rabenalt, Michael Richter, Frank Poehl, Michael Gössel. tcad, 31(6):950-957, 2012. [doi]

2010

Production test challenges for highly integrated mobile phone SOCs - A case studyFrank Poehl, Frank Demmerle, Juergen Alt, Hermann Obermeir. ets 2010: 17-22 [doi]

2007

On-chip evaluation, compensation and storage of scan diagnosis dataFrank Poehl, Matthias Beck, Ralf Arnold, Jan Rzeha, Thomas Rabenalt, Michael Gössel. iet-cdt, 1(3):207-212, 2007. [doi]

2006

On-Chip Evaluation, Compensation, and Storage of Scan Diagnosis Data - A Test Time Efficient Scan Diagnosis ArchitectureFrank Poehl, Jan Rzeha, Matthias Beck, Michael Gössel, Ralf Arnold, Peter Ossimitz. emnets 2006: 239-246 [doi]

2005

Measures to Improve Delay Fault Testing on Low-Cost Testers - A Case StudyMatthias Beck, Olivier Barondeau, Frank Poehl, Xijiang Lin, Ron Press. vts 2005: 223-228 [doi]

Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test QualityMatthias Beck, Olivier Barondeau, Martin Kaibel, Frank Poehl, Xijiang Lin, Ron Press. date 2005: 56-61 [doi]

2003

Industrial Experience with Adoption of EDT for Low-Cost Test without ConcessionsFrank Poehl, Matthias Beck, Ralf Arnold, Peter Muhmenthaler, Nagesh Tamarapalli, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski. itc 2003: 1211-1220 [doi]

1999

Quality Determination for Gate Delay Fault Tests Considering Three-State ElementsFrank Poehl, Walter Anheier. et, 14(1-2):49-55, 1999. [doi]

Sign in or sign up to see more results.

runs on WebDSL