High-Speed TLP and ESD Characterization of ICs - researchr publication authors

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Kathleen Muhonen, Evan Grund, Robert Ashton. High-Speed TLP and ESD Characterization of ICs. In IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, BCICTS 2021, Monterey, CA, USA, December 5-8, 2021. pages 1-6, IEEE, 2021. [doi]

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