Nilanjan Mukherjee. Improving Test Quality Using Test Data Compression. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. pages 463, IEEE Computer Society, 2005. [doi]
@inproceedings{Mukherjee05:0,
title = {Improving Test Quality Using Test Data Compression},
author = {Nilanjan Mukherjee},
year = {2005},
doi = {10.1109/ATS.2005.70},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2005.70},
tags = {testing, data-flow},
researchr = {https://researchr.org/publication/Mukherjee05%3A0},
cites = {0},
citedby = {0},
pages = {463},
booktitle = {14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India},
publisher = {IEEE Computer Society},
isbn = {0-7695-2481-8},
}