A Prony-Based Curve-Fitting Method for Characterization of RF Pulses From Optoelectronic Devices

Saptarshi Mukherjee, Karen Dowling, Yicong Dong, Kexin Li, Adam Conway, Shaloo Rakheja, Lars F. Voss. A Prony-Based Curve-Fitting Method for Characterization of RF Pulses From Optoelectronic Devices. IEEE Signal Process. Lett., 29:364-368, 2022. [doi]

Abstract

Abstract is missing.