Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer. Defect Aware to Power Conscious Tests - The New DFT Landscape. In VLSI Design 2009: Improving Productivity through Higher Abstraction, The 22nd International Conference on VLSI Design, New Delhi, India, 5-9 January 2009. pages 23-25, IEEE, 2009. [doi]
Abstract is missing.