Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer. Parameterizable Testing Scheme for FIR Filters. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 694-703, IEEE Computer Society, 1997.
@inproceedings{MukherjeeRT97:0,
title = {Parameterizable Testing Scheme for FIR Filters},
author = {Nilanjan Mukherjee and Janusz Rajski and Jerzy Tyszer},
year = {1997},
tags = {testing},
researchr = {https://researchr.org/publication/MukherjeeRT97%3A0},
cites = {0},
citedby = {0},
pages = {694-703},
booktitle = {Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997},
publisher = {IEEE Computer Society},
isbn = {0-7803-4209-7},
}