Statistical design and optimization of SRAM cell for yield enhancement

Saibal Mukhopadhyay, Hamid Mahmoodi-Meimand, Kaushik Roy. Statistical design and optimization of SRAM cell for yield enhancement. In 2004 International Conference on Computer-Aided Design (ICCAD 04), November 7-11, 2004, San Jose, CA, USA. pages 10-13, IEEE Computer Society / ACM, 2004. [doi]

Authors

Saibal Mukhopadhyay

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Hamid Mahmoodi-Meimand

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Kaushik Roy

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