Analysis of Field Devices Used in Industrial Control Systems

John Mulder, Moses Schwartz, Michael Berg, Jonathan Van Houten, Jorge Mario Urrea, Alex Pease. Analysis of Field Devices Used in Industrial Control Systems. In Jonathan Butts, Sujeet Shenoi, editors, Critical Infrastructure Protection VI - 6th IFIP WG 11.10 International Conference, ICCIP 2012, Washington, DC, USA, March 19-21, 2012, Revised Selected Papers. Volume 390 of IFIP Advances in Information and Communication Technology, pages 45-57, Springer, 2012. [doi]

Abstract

Abstract is missing.