Barry John Muldrey, Sabyasachi Deyati, Abhijit Chatterjee. Concurrent Stimulus and Defect Magnitude Optimization for Detection of Weakest Shorts and Opens in Analog Circuits. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 96-101, IEEE Computer Society, 2016. [doi]
@inproceedings{MuldreyDC16,
title = {Concurrent Stimulus and Defect Magnitude Optimization for Detection of Weakest Shorts and Opens in Analog Circuits},
author = {Barry John Muldrey and Sabyasachi Deyati and Abhijit Chatterjee},
year = {2016},
doi = {10.1109/ATS.2016.61},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2016.61},
researchr = {https://researchr.org/publication/MuldreyDC16},
cites = {0},
citedby = {0},
pages = {96-101},
booktitle = {25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016},
publisher = {IEEE Computer Society},
isbn = {978-1-5090-3809-1},
}