An In-Place Processor Design for Real-Value FFTs Targeting in-situ Dynamic ADC Test

Brendan Mullane, Vincent O'Brien. An In-Place Processor Design for Real-Value FFTs Targeting in-situ Dynamic ADC Test. In IEEE 61st International Midwest Symposium on Circuits and Systems, MWSCAS 2018, Windsor, ON, Canada, August 5-8, 2018. pages 591-594, IEEE, 2018. [doi]

Abstract

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