Double-cantilever device for Atomic Force Microscopy in dynamic noncontact-mode

A.-D. Müller, F. Müller, J. Middeke, J. Mehner, J. Wibbeler, Th. Gessner, M. Hietschold. Double-cantilever device for Atomic Force Microscopy in dynamic noncontact-mode. Microelectronics Reliability, 42(9-11):1685-1688, 2002. [doi]

Abstract

Abstract is missing.