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Brian Mullins, Hossein Asadi, Mehdi Baradaran Tahoori, David R. Kaeli, Kevin Granlund, Rudy Bauer, Scott Romano. Case Study: Soft Error Rate Analysis in Storage Systems. In 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA. pages 256-264, IEEE Computer Society, 2007. [doi]

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