Uniform random sampling product configurations of feature models that have numerical features: [research]

Daniel-Jesus Munoz, Jeho Oh, Mónica Pinto, Lidia Fuentes, Don S. Batory. Uniform random sampling product configurations of feature models that have numerical features: [research]. In Thorsten Berger, Philippe Collet, Laurence Duchien, Thomas Fogdal, Patrick Heymans, Timo Kehrer, Jabier Martinez, Raúl Mazo, Leticia Montalvillo, Camille Salinesi, Xhevahire Tërnava, Thomas Thüm, Tewfik Ziadi, editors, Proceedings of the 23rd International Systems and Software Product Line Conference, SPLC 2019, Volume A, Paris, France, September 9-13, 2019. ACM, 2019. [doi]

Abstract

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