SEU sensitivity of Junctionless Single-Gate SOI MOSFETs-based 6T SRAM cells investigated by 3D TCAD simulation

Daniela Munteanu, Jean-Luc Autran. SEU sensitivity of Junctionless Single-Gate SOI MOSFETs-based 6T SRAM cells investigated by 3D TCAD simulation. Microelectronics Reliability, 55(9-10):1501-1505, 2015. [doi]

Authors

Daniela Munteanu

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Jean-Luc Autran

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