Daniela Munteanu, Jean-Luc Autran. SEU sensitivity of Junctionless Single-Gate SOI MOSFETs-based 6T SRAM cells investigated by 3D TCAD simulation. Microelectronics Reliability, 55(9-10):1501-1505, 2015. [doi]
@article{MunteanuA15,
title = {SEU sensitivity of Junctionless Single-Gate SOI MOSFETs-based 6T SRAM cells investigated by 3D TCAD simulation},
author = {Daniela Munteanu and Jean-Luc Autran},
year = {2015},
doi = {10.1016/j.microrel.2015.06.107},
url = {http://dx.doi.org/10.1016/j.microrel.2015.06.107},
researchr = {https://researchr.org/publication/MunteanuA15},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {55},
number = {9-10},
pages = {1501-1505},
}