Keisuke Murakami. A heuristic algorithm for substrates testing in MCM. In 2011 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), Singapore, Singapore, December 6-9, 2011. pages 121-125, IEEE, 2011. [doi]
@inproceedings{Murakami11,
title = {A heuristic algorithm for substrates testing in MCM},
author = {Keisuke Murakami},
year = {2011},
doi = {10.1109/IEEM.2011.6117891},
url = {http://dx.doi.org/10.1109/IEEM.2011.6117891},
researchr = {https://researchr.org/publication/Murakami11},
cites = {0},
citedby = {0},
pages = {121-125},
booktitle = {2011 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), Singapore, Singapore, December 6-9, 2011},
publisher = {IEEE},
isbn = {978-1-4577-0740-7},
}