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Industry-Scale IR-Based Bug Localization: A Perspective from Facebook

Vijayaraghavan Murali, Lee Gross, Rebecca Qian, Satish Chandra 0001. Industry-Scale IR-Based Bug Localization: A Perspective from Facebook. In 43rd IEEE/ACM International Conference on Software Engineering: Software Engineering in Practice, ICSE (SEIP) 2021, Madrid, Spain, May 25-28, 2021. pages 188-197, IEEE, 2021. [doi]

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Vijayaraghavan Murali

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Lee Gross

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Rebecca Qian

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Satish Chandra 0001

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