Vijayaraghavan Murali, Lee Gross, Rebecca Qian, Satish Chandra 0001. Industry-Scale IR-Based Bug Localization: A Perspective from Facebook. In 43rd IEEE/ACM International Conference on Software Engineering: Software Engineering in Practice, ICSE (SEIP) 2021, Madrid, Spain, May 25-28, 2021. pages 188-197, IEEE, 2021. [doi]
@inproceedings{MuraliGQ021,
title = {Industry-Scale IR-Based Bug Localization: A Perspective from Facebook},
author = {Vijayaraghavan Murali and Lee Gross and Rebecca Qian and Satish Chandra 0001},
year = {2021},
doi = {10.1109/ICSE-SEIP52600.2021.00028},
url = {https://doi.org/10.1109/ICSE-SEIP52600.2021.00028},
researchr = {https://researchr.org/publication/MuraliGQ021},
cites = {0},
citedby = {0},
pages = {188-197},
booktitle = {43rd IEEE/ACM International Conference on Software Engineering: Software Engineering in Practice, ICSE (SEIP) 2021, Madrid, Spain, May 25-28, 2021},
publisher = {IEEE},
isbn = {978-1-6654-3869-8},
}