B. Muralikrishnan, K. Najarian, J. Raja. Process Mapping and Functional Correlation in Surface Metrology: A Novel Clustering Application. In ICPR (1). pages 29-32, 2002. [doi]
@inproceedings{MuralikrishnanNR02,
title = {Process Mapping and Functional Correlation in Surface Metrology: A Novel Clustering Application},
author = {B. Muralikrishnan and K. Najarian and J. Raja},
year = {2002},
doi = {10.1109/ICPR.2002.1044581},
url = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2002.1044581},
researchr = {https://researchr.org/publication/MuralikrishnanNR02},
cites = {0},
citedby = {0},
pages = {29-32},
booktitle = {ICPR (1)},
}