Hirokazu Muramatsu, Takashi Kobayashi, Takahiro Sugiyama, Keiichi Abe. Improvement of Matching and Evaluation in Handwritten Numeral Recognition Using Flexible Standard Patterns. In 7th International Conference on Document Analysis and Recognition (ICDAR 2003), 2-Volume Set, 3-6 August 2003, Edinburgh, Scotland, UK. pages 273-277, IEEE Computer Society, 2003. [doi]
Abstract is missing.