Naoki Muramoto, Hai-Tao Yu. Deep Metric Learning Based on Rank-sensitive Optimization of Top-k Precision. In Mathieu d'Aquin, Stefan Dietze, Claudia Hauff, Edward Curry, Philippe Cudré-Mauroux, editors, CIKM '20: The 29th ACM International Conference on Information and Knowledge Management, Virtual Event, Ireland, October 19-23, 2020. pages 2161-2164, ACM, 2020. [doi]
Abstract is missing.