Math Muris. Integrating boundary scan test into an ASIC design flow. In Proceedings IEEE International Test Conference 1990, Washington, D.C., USA, September 10-14, 1990. pages 472-477, IEEE Computer Society, 1990. [doi]
@inproceedings{Muris90,
title = {Integrating boundary scan test into an ASIC design flow},
author = {Math Muris},
year = {1990},
doi = {10.1109/TEST.1990.114056},
url = {http://dx.doi.org/10.1109/TEST.1990.114056},
researchr = {https://researchr.org/publication/Muris90},
cites = {0},
citedby = {0},
pages = {472-477},
booktitle = {Proceedings IEEE International Test Conference 1990, Washington, D.C., USA, September 10-14, 1990},
publisher = {IEEE Computer Society},
isbn = {0-8186-9064-},
}