Sho Muroga, Y. Shimada, Yasushi Endo, Satoshi Tanaka, Masahiro Yamaguchi, Naoya Azuma, Makoto Nagata, Motoki Murakami, Kazuaki Hori, Satoru Takahashi. In-band spurious attenuation in LTE-class RFIC chip using a soft magnetic thin film. In 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2013, Nara, Japan, December 15-18, 2013. pages 47-52, IEEE, 2013. [doi]
@inproceedings{MurogaSETYANMHT13,
title = {In-band spurious attenuation in LTE-class RFIC chip using a soft magnetic thin film},
author = {Sho Muroga and Y. Shimada and Yasushi Endo and Satoshi Tanaka and Masahiro Yamaguchi and Naoya Azuma and Makoto Nagata and Motoki Murakami and Kazuaki Hori and Satoru Takahashi},
year = {2013},
doi = {10.1109/EMCCompo.2013.6735171},
url = {https://doi.org/10.1109/EMCCompo.2013.6735171},
researchr = {https://researchr.org/publication/MurogaSETYANMHT13},
cites = {0},
citedby = {0},
pages = {47-52},
booktitle = {9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2013, Nara, Japan, December 15-18, 2013},
publisher = {IEEE},
}