M. G. Sarwar Murshed, James J. Carroll, Nazar Khan, Faraz Hussain 0001. Resource-aware On-device Deep Learning for Supermarket Hazard Detection. In M. Arif Wani, Feng Luo 0001, Xiaolin Andy Li, Dejing Dou, Francesco Bonchi, editors, 19th IEEE International Conference on Machine Learning and Applications, ICMLA 2020, Miami, FL, USA, December 14-17, 2020. pages 871-876, IEEE, 2020. [doi]
Abstract is missing.