'Shifting-left' Zero Defect Scan Test Development to Launch Automotive PPM-ready Products

Ravi J. N, Stephen Traynor. 'Shifting-left' Zero Defect Scan Test Development to Launch Automotive PPM-ready Products. In IEEE International Test Conference, ITC 2025, San Diego, CA, USA, September 20-26, 2025. pages 377-381, IEEE, 2025. [doi]

Authors

Ravi J. N

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Stephen Traynor

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