Efficient Divide-And-Conquer Ray Tracing using Ray Sampling

Kosuke Nabata, Kei Iwasaki, Yoshinori Dobashi, Tomoyuki Nishita. Efficient Divide-And-Conquer Ray Tracing using Ray Sampling. In Kayvon Fatahalian, Christian Theobalt, Jaakko Lehtinen, editors, High-Performance Graphics 2013, Anaheim, California, USA, July 19-21, 2013. Proceedings. pages 129-136, ACM, 2013. [doi]

@inproceedings{NabataIDN13,
  title = {Efficient Divide-And-Conquer Ray Tracing using Ray Sampling},
  author = {Kosuke Nabata and Kei Iwasaki and Yoshinori Dobashi and Tomoyuki Nishita},
  year = {2013},
  doi = {10.1145/2492045.2492059},
  url = {http://dx.doi.org/10.1145/2492045.2492059},
  researchr = {https://researchr.org/publication/NabataIDN13},
  cites = {0},
  citedby = {0},
  pages = {129-136},
  booktitle = {High-Performance Graphics 2013, Anaheim, California, USA, July 19-21, 2013. Proceedings},
  editor = {Kayvon Fatahalian and Christian Theobalt and Jaakko Lehtinen},
  publisher = {ACM},
  isbn = {978-1-4503-2135-8},
}