Kosuke Nabata, Kei Iwasaki, Yoshinori Dobashi, Tomoyuki Nishita. Efficient Divide-And-Conquer Ray Tracing using Ray Sampling. In Kayvon Fatahalian, Christian Theobalt, Jaakko Lehtinen, editors, High-Performance Graphics 2013, Anaheim, California, USA, July 19-21, 2013. Proceedings. pages 129-136, ACM, 2013. [doi]
Abstract is missing.