Karine M. Nacano, Marcelo E. Pellenz, Marcos Vinicio Haas Rambo, Edgard Jamhour, Voldi C. Zambenedetti, Ivan Chueiri, Daniel Benetti. An ML-based Strategy to Identify Insulation Degradation in High Voltage Capacitive Bushings. In IEEE Canadian Conference on Electrical and Computer Engineering, CCECE 2022, Halifax, NS, Canada, September 18-20, 2022. pages 256-262, IEEE, 2022. [doi]
Abstract is missing.