Evaluation of the Impact of Diagnostic Coverage and Common Cause Failures on Multi-Sensor Architectures in SIS Design

Fatima Ezzahra Nadir, Mohammed Bsiss, Benaissa Amami. Evaluation of the Impact of Diagnostic Coverage and Common Cause Failures on Multi-Sensor Architectures in SIS Design. In 7th IEEE Congress on Information Science and Technology, CiSt 2023, Agadir - Essaouira, Morocco, December 16-22, 2023. pages 715-720, IEEE, 2023. [doi]

Abstract

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